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    Determination of the complex permittivity of each layer for a bi-layer dielectric material using transmission (ABCD) matrix in Ku-Band frequency

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    URI: http://hdl.handle.net/10902/9355
    ISSN: 1791-9320
    ISSN: 1791-2377
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    Author
    Elmajid, Hassan; Terhzaz, Jaouad; Ammor, Hassan; Chaibi, Mohamed; Mediavilla Sánchez, ÁngelAutoridad Unican
    Date
    2016
    Derechos
    © Journal of Engineering Science and Technology Review
    Publicado en
    Journal of Engineering Science and Technology Review, 2016, 9(1), 61-65
    Publisher
    Kavala Institute of Technology
    Palabras clave
    Complex permittivity
    Microwave
    Transmission ABCD matrix
    Dielectric material
    Optimizations methods
    Abstract:
    A new technique is presented to determine the complex permittivity of each layer for a bi-layer dielectric material. The bilayer material sample is loaded in a Ku-band rectangular waveguide WR62 and its two port S-parameters are measured as a function of frequency using the E8634A Network Analyzer. Also, by applying transmission (ABCD) matrix, expressions for the S-parameters of the bi-layer dielectric material as a function of complex permittivity of each layer are developed. To estimate the complex permittivity of each layer’s dielectric material, the square sums of errors between the measured and calculated S-parameters are minimised using a nonlinear optimization algorithm. The complex permittivity of each layer for a bi-layer dielectric material such as FR4-Teflon, FR4-Delrin and Delrin-Teflon are determined at the Ku-band frequencies, and the average relative errors between the individual dielectric materials and those of each individual layer of the bi-layer dielectric materials are calculated.
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    UNIVERSIDAD DE CANTABRIA

    Repositorio realizado por la Biblioteca Universitaria utilizando DSpace software
    Contact Us | Send Feedback
    Metadatos sujetos a:licencia de Creative Commons Reconocimiento 3.0 España