Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light
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AuthorAlbella Echave, Pablo; Saiz Vega, José María; Sanz Casado, Juan Marcos; González Fernández, Francisco; Moreno Gracia, Fernando
We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe–surface distance or in the refractive index of the surface.
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