Medida de componentes pasivos en criogenia
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AuthorOrtiz García, David; Villa Benito, Enrique; Cano de Diego, Juan Luis; Fuente Rodríguez, Luisa María de la; Artal Latorre, Eduardo
This paper describes the measurement system used at Universidad de Cantabria (UC) to test passive surface mount devices performance under cryogenic temperatures. These devices are used in the DC bias networks of cryogenic low noise amplifiers. The system enables the evaluation of these components from room temperature (about 300 K) to 30 K approximately. Their behaviour was tested at low frequencies, in the range from 20 Hz to 2 MHz. Capacitors based on high dielectric constant materials show a strong dependence on temperature conditions. They show a really big decrease of their capacitance when they are cooled down to cryogenic temperatures. On the other hand, low dielectric constant capacitors and thin-film resistors present low variation with temperature.
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