Procesado de medidas en el infrarrojo para la evaluación-prueba no destructiva
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AuthorGonzález Fernández, Daniel Aquilino; Ibarra Castanedo, Clemente; Madruga Saavedra, Francisco Javier; Lázaro Urrutia, José Miguel; López Higuera, José Miguel
The detection and measurement of electromagnetic emissions on the infrared spectrum leads to Non Destructive Evaluation and Testing (NDE&T) of big areas in a fast, safe, contactless and interference-free way. Thermal images of surfaces indicate the presence or void of both superficial and subsuperficial defects. However, to obtain better results than just interpreting directly the captured sequences, an important processing must be done. Infrared signatures, that are generally weak and noisy by nature, are further degraded due to detectors, imperfections, non-uniform heating, surface geometry and detection viewpoint. As a result, processing to correct some of these effects is a mandatory step prior to defect detection and/or characterization. In this article, the different methods involved in common analysis are presented. The fusion of fields, from optics to mechanics through computers is clearly shown.
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