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dc.contributor.authorSancho Lucio, Sergio Miguel 
dc.contributor.authorRamírez Terán, Franco Ariel 
dc.contributor.authorSuárez Rodríguez, Almudena 
dc.contributor.otherUniversidad de Cantabriaes_ES
dc.date.accessioned2017-01-12T07:50:08Z
dc.date.available2017-01-12T07:50:08Z
dc.date.issued2014-12
dc.identifier.issn0018-9480
dc.identifier.issn1557-9670
dc.identifier.otherTEC2011-29264-C03-01es_ES
dc.identifier.urihttp://hdl.handle.net/10902/9971
dc.description.abstractA detailed investigation of cycle slips in injection-locked oscillators (ILOs) and analog frequency dividers is presented. This nonlinear phenomenon gives rise to a temporal desynchronization between the injected oscillator and the input source due to noise perturbations. It involves very different time scales so even envelope-transient-based Monte Carlo analyses may suffer from high computational cost. The analysis method is based on an initial extraction of a reduced-order nonlinear model of the injected oscillator based on harmonic-balance simulations. This model has been improved with a more accurate description of oscillation dependence on the input source either at the fundamental frequency or, in the case of a frequency divider, at a given harmonic frequency. The reduced-order model enables an efficient stochastic analysis of the system based on the use of the associated Fokker-Planck equation in the phase probability density function. Several methods for the solution of the associated Fokker-Planck equation are compared with one of them being applicable under a wider range of system specifications. The analysis enables the prediction of the parameter-space regions that are best protected against cycle slips. The technique has been applied to two microwave ILOs and has been validated through commercial software envelope simulations in situations where the computational cost of the envelope simulations was acceptable, and through measurements. The measurement procedure of the cycle slipping phenomenon has been significantly improved with respect to previous work.es_ES
dc.description.sponsorshipThis work was supported by the Spanish Ministry of Economy and Competitiveness under Contract TEC2011-29264-C03-01.es_ES
dc.format.extent15 p.es_ES
dc.language.isoenges_ES
dc.publisherInstitute of Electrical and Electronics Engineers Inc.es_ES
dc.rights© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.es_ES
dc.sourceIEEE Transactions on Microwave Theory and Techniques, 2014, 62 (12), 3318 - 3332es_ES
dc.subject.otherCycle slipses_ES
dc.subject.otherInjection-locked oscillatorses_ES
dc.subject.otherNonlinear stochastic analysises_ES
dc.subject.otherSynchronizationes_ES
dc.titleStochastic analysis of cycle slips in injection-locked oscillators and analog frequency dividerses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publisherVersionhttps://doi.org/10.1109/TMTT.2014.2365798es_ES
dc.rights.accessRightsopenAccesses_ES
dc.identifier.DOI10.1109/TMTT.2014.2365798
dc.type.versionacceptedVersiones_ES


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