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Departamento de Tecnología Electrónica e Ing. Sistemas y Automática (TEISA): Envíos recientes
Mostrando ítems 641-660 de 880
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Blind breast tissue diagnosis using independent component analysis of localized backscattering response
Eguizabal Aguado, Alma
; Laughney, Ashley M.; García Allende, Pilar Beatriz; Krishnaswamy, Venkataramanan; Wells, Wendy A.; Paulsen, Keith D.; Pogue, Brian William; López Higuera, José Miguel; Conde Portilla, Olga María (SPIE Society of Photo-Optical Instrumentation Engineers, 2012-02-09)
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Recovering a fiber Bragg grating axial strain distribution from its reflection spectrum
Rodríguez Cobo, Luis; Cobo García, Adolfo; López Higuera, José Miguel (The Optical Society (OSA), 2013-07-01)
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Direct identification of breast cancer pathologies using blind separation of label-free localized reflectance measurements
Eguizabal Aguado, Alma; Laughney, Ashley M.; García Allende, Pilar Beatriz; Krishnaswamy, Venkataramanan; Wells, Wendy A.; Paulsen, Keith D.; Pogue, Brian William; López Higuera, José Miguel; Conde Portilla, Olga María (The Optical Society (OSA), 2013-07-01)
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Arc-welding process control based on back face thermography: application to the manufacturing of nuclear steam generators
Cobo García, Adolfo; Mirapeix Serrano, Jesús María; Conde Portilla, Olga María; García Allende, Pilar Beatriz; Madruga Saavedra, Francisco Javier; López Higuera, José Miguel (SPIE Society of Photo-Optical Instrumentation Engineers, 2007-04-09)
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Characterization of new thermo-responsive hydrogels for optical sensing applications
Rueda Sánchez, Juan Carlos; Contreras Villalobos, Kevin; Coello Paria, Rafael; Lomer Barboza, Mauro Matías; Komber, Hartmut; Zschoche, Stefan; Voit, Brigitte (SPIE Society of Photo-Optical Instrumentation Engineers, 2007-05-07)
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Laser-induced breakdown spectroscopy: fundamentals, applications, and challenges
Anabitarte García, Francisco; Cobo García, Adolfo; López Higuera, José Miguel (Hindawi Publishing Corporation, 2012)
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Enhanced tumor contrast during breast lumpectomy provided by independent component analysis of localized reflectance measures
Eguizabal Aguado, Alma; Laughney, Ashley M.; García Allende, Pilar Beatriz; Krishnaswamy, Venkataramanan; Wells, Wendy A.; Paulsen, Keith D.; Pogue, Brian William; López Higuera, José Miguel; Conde Portilla, Olga María (SPIE Society of Photo-Optical Instrumentation Engineers, 2012-02-09)
