Comprehensive polarimetric analysis of Spectralon white reflectance standard in a wide visible range

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URI: http://hdl.handle.net/10902/3870
ISSN: 1559-128X
ISSN: 2155-3165
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Autoría
Sanz Casado, Juan MarcosAutoridad Unican; Extremiana Vázquez, Cristina; Saiz Vega, José MaríaAutoridad Unican
Fecha
2013-08-19
Derechos
© 2013 Optical Society of America. This paper was published in Applied Optics and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/AO.52.006051. Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Publicado en
Applied Optics, Vol. 52, Issue 24, pp. 6051-6062 (2013)
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The Optical Society (OSA)
Resumen/Abstract
Since polarimetry has extended its use for the study of scattering from surfaces and tissues, Spectralon, a white reflectance standard, is acquiring the role of a polarimetric standard. Both the behavior of Spectralon as a Lambertian surface and its performance as a perfect depolarizer are analyzed in detail. The accuracy of our dynamic polarimeter, together with the polar decomposition to describe the Mueller matrix (MM) depolarizing action, combine to produce a powerful tool for the proper analysis of this scattering surface. Results allowed us to revisit, for confirmation or revision, the role of some MM elements, as described in the bibliography. The conditions under which it can be considered a good Lambertian surface are specified in terms of incidence and scattering angle and verified over a large wavelength range.
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