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dc.contributor.authorValle Gutiérrez, Ángel 
dc.contributor.authorRosado, A.
dc.contributor.authorSoldevilla, G.
dc.contributor.authorEsquivias, I.
dc.contributor.otherUniversidad de Cantabriaes_ES
dc.date.accessioned2025-12-03T12:19:56Z
dc.date.available2025-12-03T12:19:56Z
dc.date.issued2025-11
dc.identifier.issn1094-4087
dc.identifier.otherPID2021-123459OB-C21es_ES
dc.identifier.otherPID2021-123459OB-C22 ; TED2021-131957B-100es_ES
dc.identifier.urihttps://hdl.handle.net/10902/38385
dc.description.abstractWe report on the experimental analysis of the statistics of the optical phase of the light emitted by a distributed-feedback (DFB) laser. We measure the dependence of the phase diffusion coefficient on the applied bias current in the region around the threshold current. We measure the phase noise statistics using three different methods based on i) averages of the noise phase trajectories over different temporal windows, ii) the variance of the phase noise difference, and iii) the frequency noise spectral density. The comparison between the results obtained with these methods is succesful. We obtain that the phase diffusion coefficient monotonously decreases with the bias current in the region around threshold. We finally compare our experimental results with simple analytical expressions for the below and above threshold cases based on Schawlow-Townes laws.es_ES
dc.description.sponsorshipMinisterio de Ciencia, Innovación y Universidades (PID2021-123459OB-C21MCIN/AEI/10.13039/501100011033, PID2021-123459OB-C22,MCIN/AEI/FEDER,UE, TED2021-131957B-100MCIN/AEI/10.13039/501100011033).es_ES
dc.format.extent12 p.es_ES
dc.language.isoenges_ES
dc.publisherOptica Publishing Groupes_ES
dc.rights© 2025 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement. Users may use, reuse, and build upon the article, or use the article for text or data mining, so long as such uses are for non-commercial purposes and appropriate attribution is maintained. All other rights are reservedes_ES
dc.sourceOptics Express, 2025, 33(23), 48676-48687es_ES
dc.titleMeasurement of the optical phase statistics of single-mode semiconductor lasers biased around the threshold currentes_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publisherVersionhttps://doi.org/10.1364/OE.574701es_ES
dc.rights.accessRightsopenAccesses_ES
dc.identifier.DOI10.1364/OE.574701
dc.type.versionpublishedVersiones_ES


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