Robust ku-band low-noise amplifier in GaN HEMT technology
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Fuente Rodríguez, Luisa María de la
; Aja Abelán, Beatriz
; Villa Benito, Enrique
; Artal Latorre, Eduardo
; Neininger, Philipp; Friesicke, Christian; Thome, Fabian; Brückner, Peter; Lujambio, Aintzane; Lobato, David; Rueda, Mario; Cuadrado-Calle, David; Dutto, Valerie
Fecha
2025Derechos
© 2025 EuMA (European Microwave Association)
Publicado en
55th European Microwave Conference (EuMC), Utrecth, Netherlands, 2025, 346-349
Editorial
Institute of Electrical and Electronics Engineers, Inc.
Enlace a la publicación
Palabras clave
Gallium nitride (GaN)
HEMT
Ku-band
Lownoise amplifiers
Millimeter wave integrated circuits
MMIC
Noise figure
Silicon carbide
Mm-wave
Robustness
Resumen/Abstract
This paper presents a Ku-band low-noise amplifier (LNA) based on 150-nm GaN-on-SiC technology. The 4 -stage monolithic microwave 2integrated circuit (MMIC) LNA is 3×1.5mm2 in area and it is waveguide packaged. On-wafer measurements show a small-signal gain of 35 dB and noise figure of 1.42 dB over the 13.25 to 13.75 GHz, with an average value below 1.57 dB within the whole Ku-band. Packaged characterization yields a minimum of 1.47 dB with 32.3 dB associated gain at 13.5 GHz for a 720 mW power consumption. Performed large-signal measurements demonstrate an output 1dB compression point of 12.9 dBm. The LNA is stressed with a RF CW stepped input power up to 31 dBm, for 5 min, with no significant S-parameters and noise figure degradation. The robustness and noise performance of this amplifier make it a very competitive solution for its feasible integration in the next generation satellite communication systems.
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