Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light

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URI: http://hdl.handle.net/10902/3761
ISSN: 0146-9592
ISSN: 1539-4794
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Autoría
Albella Echave, PabloAutoridad Unican; Saiz Vega, José MaríaAutoridad Unican; Sanz Casado, Juan MarcosAutoridad Unican; González Fernández, FranciscoAutoridad Unican; Moreno Gracia, FernandoAutoridad Unican
Fecha
2009-06
Derechos
© 2009 Optical Society of America. This paper was published in Optics Letters and is made available as an electronic reprint with the permission of OSA. The paper can be found at the following URL on the OSA website: http://dx.doi.org/10.1364/OL.34.001906 Systematic or multiple reproduction or distribution to multiple locations via electronic or other means is prohibited and is subject to penalties under law.
Publicado en
Optics Letters, Vol. 34, Issue 12, pp. 1906-1908 (2009)
Editorial
The Optical Society (OSA)
Resumen/Abstract
We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe–surface distance or in the refractive index of the surface.
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