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dc.contributor.authorPascual Gutiérrez, Juan Pablo 
dc.contributor.authorFernández Ibáñez, Tomás 
dc.contributor.authorZamanillo Sainz de la Maza, José María 
dc.contributor.authorFuente Rodríguez, Luisa María de la 
dc.contributor.authorArtal Latorre, Eduardo 
dc.contributor.authorHill, Daniel
dc.contributor.otherUniversidad de Cantabriaes_ES
dc.date.accessioned2013-10-07T12:48:39Z
dc.date.available2013-10-07T12:48:39Z
dc.date.issued2000-09
dc.identifier.urihttp://hdl.handle.net/10902/3580
dc.description.abstractA new non linear model for SiGe HBTs, obtained with extraction techniques from DC and RF measurements is presented. These equivalent circuit based model is able to characterize the device from low frequencies (100 Mhz) up to the millimeter band (40 GHz). Devices modeled have different dimensions of base and emitter contacts. The HBT devices have been fabricated by Daimler Chrysler Research Centre in Ulm (Germany). Experimental non linear test show good agreement with simulated values.es_ES
dc.format.extent2 p.es_ES
dc.language.isospaes_ES
dc.rights© 2000 URSI Españaes_ES
dc.sourceURSI 2000, XV Simposium Nacional de la Unión Científica Internacional de Radio, Zaragozaes_ES
dc.titleModelo no lineal banda ancha para transistores HBT de SiGees_ES
dc.typeinfo:eu-repo/semantics/conferenceObjectes_ES
dc.rights.accessRightsopenAccesses_ES
dc.type.versionpublishedVersiones_ES


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