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dc.contributor.authorLafuente Palacín, María Teresa
dc.contributor.authorPascual Gutiérrez, Juan Pablo 
dc.contributor.authorFuente Rodríguez, Luisa María de la 
dc.contributor.authorArtal Latorre, Eduardo 
dc.contributor.otherUniversidad de Cantabriaes_ES
dc.date.accessioned2013-10-02T07:32:00Z
dc.date.available2013-10-02T07:32:00Z
dc.date.issued2002-09
dc.identifier.urihttp://hdl.handle.net/10902/3503
dc.description.abstractAn approach to heterojunction bipolar transistors (HBT’s) characterization and modeling is presented whit a compact HBT nonlinear circuit model which accounts for the temperature dependence effects. The parameters are extracted from DC and S-parameters measurements. The power characteristics of the device are then predicted using the extracted model without any further optimizations. The model has been implemented in MDS –HP nonlinear simulator. Good fitting is obtained in DC and scattering curves up to 40 GHz. An amplifier designed with the HBT67 transistors is presented. Simulations show good agreement with measurements.es_ES
dc.format.extent6 p.es_ES
dc.language.isospaes_ES
dc.rights© 2002 URSI Españaes_ES
dc.sourceURSI 2002, XVII Simposium Nacional de la Unión Científica Internacional de Radio, Alcalá de Henareses_ES
dc.titleModelización de dispositivos de SiGe (HBTs) para un amplificador monoetapaes_ES
dc.typeinfo:eu-repo/semantics/conferenceObjectes_ES
dc.rights.accessRightsopenAccesses_ES
dc.type.versionpublishedVersiones_ES


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