| dc.contributor.author | Quirce Teja, Ana | |
| dc.contributor.author | Valle Gutiérrez, Ángel | |
| dc.contributor.author | Giménez, Carolina | |
| dc.contributor.author | Pesquera Gonzalez, Luis | |
| dc.contributor.other | Universidad de Cantabria | es_ES |
| dc.date.accessioned | 2025-01-08T13:33:14Z | |
| dc.date.available | 2025-01-08T13:33:14Z | |
| dc.date.issued | 2011-02-10 | |
| dc.identifier.issn | 0733-8724 | |
| dc.identifier.issn | 1558-2213 | |
| dc.identifier.other | TEC2009-14581-C02-02 | es_ES |
| dc.identifier.uri | https://hdl.handle.net/10902/34889 | |
| dc.description.abstract | The intensity noise spectra of several multi-transverse mode 1550-nm vertical-cavity surface-emitting lasers (VCSELs) have been experimentally investigated. For a VCSEL emitting in two parallel polarized transverse modes the noise spectra of the individual modes and total power show two resonance peaks. The frequencies at which both peaks appear have been measured as a function of the bias current. Our experimental results confirm the theoretical predictions of Valle Differences in the noise spectra are experimentally observed when considering a VCSEL emitting in three transverse modes with polarization instabilities. We show that additional peaks appear in the noise spectra of the total power as the bias current is increased. | es_ES |
| dc.description.sponsorship | This work has been funded in part by the Ministerio de Ciencia e Innovación, Spain, under project TEC2009-14581-
C02-02. | es_ES |
| dc.format.extent | 7 p. | es_ES |
| dc.language.iso | eng | es_ES |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | es_ES |
| dc.rights | © 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works | es_ES |
| dc.source | Journal of Lightwave Technology, 2011, 29(7), 1039-1045 | es_ES |
| dc.subject.other | Semiconductor lasers | es_ES |
| dc.subject.other | Vertical-cavity surfaceemitting lasers (VCSELs) | es_ES |
| dc.subject.other | Transverse modes | es_ES |
| dc.subject.other | Relative intensity noise (RIN) | es_ES |
| dc.subject.other | Mode partition noise (MPN) | es_ES |
| dc.title | Intensity noise characteristics of multimode VCSELs | es_ES |
| dc.type | info:eu-repo/semantics/article | es_ES |
| dc.relation.publisherVersion | https://doi.org/10.1109/JLT.2011.2112754 | es_ES |
| dc.rights.accessRights | openAccess | es_ES |
| dc.relation.projectID | info:eu-repo/grantAgreement/MICINN//TEC2009-14581-C02-02/ES/Laseres De Semiconductor Avanzados Para Procesado Todo-Optico De Señal Y Generacion De Pulsos Cortos/ | es_ES |
| dc.identifier.DOI | 10.1109/JLT.2011.2112754 | |
| dc.type.version | acceptedVersion | es_ES |
