Intensity noise characteristics of multimode VCSELs

Quirce Teja, Ana; Valle Gutiérrez, Ángel; Giménez, Carolina; Pesquera Gonzalez, Luis

doi:10.1109/JLT.2011.2112754

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Identificadores

URI: https://hdl.handle.net/10902/34889

DOI: 10.1109/JLT.2011.2112754

ISSN: 0733-8724

ISSN: 1558-2213

Fecha

2011-02-10

Derechos

© 2011 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works

Publicado en

Journal of Lightwave Technology, 2011, 29(7), 1039-1045

Editorial

Institute of Electrical and Electronics Engineers Inc.

Enlace a la publicación

https://doi.org/10.1109/JLT.2011.2112754

Palabras clave

Semiconductor lasers

Vertical-cavity surfaceemitting lasers (VCSELs)

Transverse modes

Relative intensity noise (RIN)

Mode partition noise (MPN)

Resumen/Abstract

The intensity noise spectra of several multi-transverse mode 1550-nm vertical-cavity surface-emitting lasers (VCSELs) have been experimentally investigated. For a VCSEL emitting in two parallel polarized transverse modes the noise spectra of the individual modes and total power show two resonance peaks. The frequencies at which both peaks appear have been measured as a function of the bias current. Our experimental results confirm the theoretical predictions of Valle Differences in the noise spectra are experimentally observed when considering a VCSEL emitting in three transverse modes with polarization instabilities. We show that additional peaks appear in the noise spectra of the total power as the bias current is increased.