Mostrar el registro sencillo

dc.contributor.authorRafael Valdivia, Guillermo
dc.contributor.authorRodríguez Téllez, José
dc.contributor.authorTazón Puente, Antonio 
dc.contributor.authorFernández Ibáñez, Tomás 
dc.contributor.authorMediavilla Sánchez, Ángel 
dc.contributor.otherUniversidad de Cantabriaes_ES
dc.date.accessioned2013-09-30T08:30:17Z
dc.date.available2013-09-30T08:30:17Z
dc.date.issued2003-09
dc.identifier.urihttp://hdl.handle.net/10902/3452
dc.description.abstractIn a previous work the observed differences between the static and dynamic V-I characteristics of MESFETs and HEMTs were attributed to electric field and frequency effects that could be accounted for via the mobility figure for the device. In this paper we continue with this work by exploring in more detail the relationship between the electric field and frequency conditions on the mobility value using a HEMT device. We believe that the original multi-bias mobility measurements described in this paper can be applied equally successfully to the MESFET device.es_ES
dc.format.extent4 p.es_ES
dc.language.isospaes_ES
dc.rights© 2003 URSI Españaes_ES
dc.sourceURSI 2003, XVIII Simposium Nacional de la Unión Científica Internacional de Radio, La Coruñaes_ES
dc.titleMovilidad respecto al campo eléctrico y la frecuencia en dispositivos MESFET/HEMTes_ES
dc.typeinfo:eu-repo/semantics/conferenceObjectes_ES
dc.rights.accessRightsopenAccesses_ES
dc.type.versionpublishedVersiones_ES


Ficheros en el ítem

Thumbnail

Este ítem aparece en la(s) siguiente(s) colección(ones)

Mostrar el registro sencillo