Sistema de extracción de derivadas en régimen dinámico para dispositivos de RF/microondas

Abstract

This paper presents a novel measurement system for derivative extraction under dynamic conditions based on the utilization of pulsed signals. This kind of characterization avoids both heating and trapping effects, making possible to realize the extraction process under conditions as close as possible to the device RF behaviour. The system principles and set-up are presented and described in order to provide reliable device modelling. Moreover, results of derivative extraction for a FLL177ME MESFET are presented with the aim of highlighting differences between pulsed and traditional DC characterization.