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Detection and characterization of nano-defects located on micro-structured substrates by means of light scattering

dc.contributor.authorVideen, Gorden
dc.contributor.authorAlbella Echave, Pablo 
dc.contributor.authorGonzález Fernández, Francisco 
dc.contributor.authorMoreno Gracia, Fernando 
dc.contributor.authorSaiz Vega, José María 
dc.contributor.otherUniversidad de Cantabriaes_ES
dc.date.accessioned2023-11-21T10:45:22Z
dc.date.available2023-11-21T10:45:22Z
dc.date.issued2011
dc.identifier.isbn978-953-307-275-3
dc.identifier.urihttps://hdl.handle.net/10902/30719
dc.description.sponsorshipThe authors wish to acknowledge the funds provided by the Ministry of Education of Spain under project #FIS2007-60158. We also thank the computer resources provided by the Spanish Supercomputing Network (RES) node at Universidad de Cantabria.es_ES
dc.format.extent20 p.es_ES
dc.language.isoenges_ES
dc.rightsAtribución 3.0 Españaes_ES
dc.rights.urihttp://creativecommons.org/licenses/by/3.0/es/*
dc.sourceWave propagation, Rijeka, IntechOpen, 2011es_ES
dc.titleDetection and characterization of nano-defects located on micro-structured substrates by means of light scatteringes_ES
dc.typeinfo:eu-repo/semantics/bookes_ES
dc.relation.publisherVersionhttps://doi.org/10.5772/14049es_ES
dc.rights.accessRightsopenAccesses_ES
dc.identifier.DOI10.5772/14049
dc.type.versionpublishedVersiones_ES


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