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dc.contributor.authorGranero Belinchón, Rafael 
dc.contributor.otherUniversidad de Cantabriaes_ES
dc.date.accessioned2023-10-30T16:35:10Z
dc.date.available2023-10-30T16:35:10Z
dc.date.issued2016
dc.identifier.issn1424-0637
dc.identifier.issn1424-0661
dc.identifier.urihttps://hdl.handle.net/10902/30393
dc.description.abstractIn this note, we study a fractional Poisson–Nernst–Planck equation modeling a semiconductor device. We prove several decay estimates for the Lebesgue and Sobolev norms in one, two and three dimensions. We also provide the first term of the asymptotic expansion as t->∞es_ES
dc.format.extent25 p.es_ES
dc.language.isoenges_ES
dc.publisherSpringeres_ES
dc.rights© 2016. This version of the article has been accepted for publication, after peer review (when applicable) and is subject to Springer Nature's AM terms of use, but is not the Version of Record and does not reflect post-acceptance improvements, or any corrections. The Version of Record is available online at: https://doi.org/10.1007/s00023-016-0493-6es_ES
dc.sourceAnnales Henri Poincaré, 2016, 17, 3473-3498es_ES
dc.titleOn a drift-diffusion system for semiconductor deviceses_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.relation.publisherVersionhttps://doi.org/10.1007/s00023-016-0493-6es_ES
dc.rights.accessRightsopenAccesses_ES
dc.identifier.DOI10.1007/s00023-016-0493-6
dc.type.versionacceptedVersiones_ES


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