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    Automatic vector generation guided by a functional metric

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    AutomaticVectorGener ... (267.4Kb)
    Identificadores
    URI: https://hdl.handle.net/10902/27748
    DOI: 10.1117/12.887494
    ISSN: 0277-786X
    ISSN: 1996-756X
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    Autoría
    Ugarte Olano, ÍñigoAutoridad Unican; Sánchez Espeso, Pablo PedroAutoridad Unican
    Fecha
    2011-05
    Derechos
    © 2011 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
    Publicado en
    Proceedings of SPIE, 2011, 8067, 80670U
    VLSI Circuits and Systems V, Prague, Czech Republic, 2011
    Editorial
    SPIE Society of Photo-Optical Instrumentation Engineers
    Enlace a la publicación
    https://doi.org/10.1117/12.887494
    Palabras clave
    Lagrange Interpolation
    Domain testing
    Coverage
    Mutation testing
    Resumen/Abstract
    Verification is still the bottleneck of the complex digital system design process. Formal techniques have advanced in their capacity to handle more complex descriptions, but they still suffer from problems of memory or time explosion. Simulation-based techniques handle descriptions of any size or complexity, but the efficiency of these techniques is reduced with the increase in the system complexity because of the exponential increase in the number of simulation tests necessary to maintain the coverage. Semi-formal techniques combine the advantages of simulation and formal techniques as they increase the efficiency of simulation-based verification. In this area, several research works have introduced techniques that automate the generation of vectors driven by traditional coverage metrics. However, these techniques do not ensure the detection of 100% of faults. This paper presents a novel technique for the generation of vectors. A major benefit of the technique is the more efficient generation of test-benches than when using techniques based on structural metrics. The technique introduced is more efficient since it relies on a novel coverage metric, which is more directly correlated to functional faults than structural coverage metrics (line, branch, etc.). The proposed coverage metric is based on an abstraction of the system as a set of polynomials where all system behaviours are described by a set of coefficients. By assuming a finite precision of coefficients and a maximum degree of polynomials, all the system behaviors, including both the correct and the incorrect ones, can be modeled. This technique applies mathematical theories (computer algebra and number theory) to calculate the coverage and to generate vectors which maximize coverage. Moreover, in this work, a tool which implements the technique has been developed. This tool takes a C-based system description and provides the coverage and the generated vectors as output.
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    UNIVERSIDAD DE CANTABRIA

    Repositorio realizado por la Biblioteca Universitaria utilizando DSpace software
    Contacto | Sugerencias
    Metadatos sujetos a:licencia de Creative Commons Reconocimiento 4.0 España