Polarization analysis of the scattered radiation by silicon nanoparticles in the infrared

Abstract

In this work we have studied the spectral dependence of the linear polarization degree at a right-angle scattering configuration (RASC) for silicon nanoparticles (R ∼ 200nm) in the IR (1-2μm). For isolated and isotropic particles smaller than the incident wavelength, this parameter is complementary to the conventional spectral analysis for showing deviations from the pure electric dipole-like response due to either magnetic dipole-like or higher-order contributions.