Método de medida de dispositivos para banda milimétrica usando transiciones coplanares de banda ancha

dc.contributor.author	Villa Benito, Enrique
dc.contributor.author	Aja Abelán, Beatriz
dc.contributor.author	Fuente Rodríguez, Luisa María de la
dc.contributor.author	Artal Latorre, Eduardo
dc.contributor.other	Universidad de Cantabria	es_ES
dc.date.accessioned	2013-07-17T06:53:22Z
dc.date.available	2013-07-17T06:53:22Z
dc.date.issued	2008-09
dc.identifier.isbn	978-84-612-6291-5
dc.identifier.uri	http://hdl.handle.net/10902/2666
dc.description.abstract	A wideband coplanar to microstrip transition without via holes has been used for device testing at millimeter wave frequencies (from 20 to 40 GHz), in order to have an accurate characterisation of the tested devices. Circuits under tests are built on 0.254 mm thick Alumina substrate. Test method, with a coplanar probe station, has been checked with different devices, and validated by comparison with commercial coplanar to microstrip transitions with via holes.	es_ES
dc.format.extent	4 p.	es_ES
dc.language.iso	spa	es_ES
dc.rights	© 2008 URSI España	es_ES
dc.source	URSI 2008, XXIII Simposium Nacional de la Unión Científica Internacional de Radio, Madrid	es_ES
dc.title	Método de medida de dispositivos para banda milimétrica usando transiciones coplanares de banda ancha	es_ES
dc.type	info:eu-repo/semantics/conferenceObject	es_ES
dc.rights.accessRights	openAccess	es_ES
dc.type.version	publishedVersion	es_ES

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