Método de medida de dispositivos para banda milimétrica usando transiciones coplanares de banda ancha

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URI: http://hdl.handle.net/10902/2666
ISBN: 978-84-612-6291-5
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Autoría
Villa Benito, EnriqueAutoridad Unican; Aja Abelán, BeatrizAutoridad Unican; Fuente Rodríguez, Luisa María de laAutoridad Unican; Artal Latorre, EduardoAutoridad Unican
Fecha
2008-09
Derechos
© 2008 URSI España
Publicado en
URSI 2008, XXIII Simposium Nacional de la Unión Científica Internacional de Radio, Madrid
Resumen/Abstract
A wideband coplanar to microstrip transition without via holes has been used for device testing at millimeter wave frequencies (from 20 to 40 GHz), in order to have an accurate characterisation of the tested devices. Circuits under tests are built on 0.254 mm thick Alumina substrate. Test method, with a coplanar probe station, has been checked with different devices, and validated by comparison with commercial coplanar to microstrip transitions with via holes.
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