Mostrar el registro sencillo

dc.contributor.authorMirapeix Serrano, Jesús María 
dc.contributor.authorGarcía Allende, Pilar Beatriz
dc.contributor.authorCobo García, Adolfo 
dc.contributor.authorConde Portilla, Olga María 
dc.contributor.authorLomer Barboza, Mauro Matías 
dc.contributor.authorLópez Higuera, José Miguel 
dc.contributor.otherUniversidad de Cantabriaes_ES
dc.date.accessioned2013-06-28T12:23:25Z
dc.date.available2013-06-28T12:23:25Z
dc.date.issued2009-10-05
dc.identifier.issn1996-756X
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/10902/2540
dc.description.abstractPlasma optical spectroscopy is a technique widely used for on-line welding diagnostics, given the rich information to be found within the plasma spectra generated during the process. One of the key factors in this regard is the computational performance of the whole monitoring system, as it determines the resulting spatial resolution. The electronic temperature of the welding plasma is typically used as the output monitoring parameter, but it requires an identification of the emission lines, what implies additional processing stages. In this paper we propose the use of the line-to-continuum method to generate the system output profiles, previously choosing the required spectral band by means of the SFFS algorithm.es_ES
dc.format.extent4 p.es_ES
dc.language.isoenges_ES
dc.publisherSPIE Society of Photo-Optical Instrumentation Engineerses_ES
dc.rights© 2009 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.es_ES
dc.sourceProceedings of SPIE, 2009, vol. 7503, 75034Tes_ES
dc.source20th International Conference on Optical Fibre Sensors, Edimburgo, 2009es_ES
dc.subject.otherPlasma spectroscopyes_ES
dc.subject.otherArc-weldinges_ES
dc.subject.otherFeature selectiones_ES
dc.subject.otherQuality monitoringes_ES
dc.titleWelding diagnostics by means of line-to-continuum method and SFFS spectral band selectiones_ES
dc.typeinfo:eu-repo/semantics/conferenceObjectes_ES
dc.relation.publisherVersionhttp://dx.doi.org/10.1117/12.834914es_ES
dc.rights.accessRightsopenAccesses_ES
dc.identifier.DOI10.1117/12.834914
dc.type.versionpublishedVersiones_ES


Ficheros en el ítem

Thumbnail

Este ítem aparece en la(s) siguiente(s) colección(ones)

Mostrar el registro sencillo