Using linear polarization for sensing and monitoring nanoparticle purity

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URI: http://hdl.handle.net/10902/12019
ISSN: 0277-786X
ISSN: 1996-756X
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Autoría
Barreda Gómez, Ángela Inmaculada; Sanz Casado, Juan MarcosAutoridad Unican; Alcaraz de la Osa, RodrigoAutoridad Unican; Saiz Vega, José MaríaAutoridad Unican; Moreno Gracia, FernandoAutoridad Unican; González Fernández, FranciscoAutoridad Unican; Videen, Gorden Wayne
Fecha
2016
Derechos
Copyright 2016 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
Publicado en
Proc. of SPIE Vol. 9899 98991O-1
Editorial
SPIE Society of Photo-Optical Instrumentation Engineers
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Palabras clave
Nanoparticles
Resonances
Polarimetry
Sensing
Contaminants
Resumen/Abstract
We analyze the effect of contaminants on the quadrupolar magnetic, dipolar electric and dipolar magnetic resonances of silicon nanoparticles (NPs) by considering the spectral evolution of the linear polarization degree at right angle scattering configuration, PL(90º). From an optical point of view, a decrease in the purity of silicon nanoparticles due to the presence of contaminants impacts the NP effective refractive index. We study this effect for a silicon nanosphere of radius 200 nm embedded in different media. The weakness of the resonances induced on the PL(90º) spectrum because of the lack of purity can be used to quantify the contamination of the material. In addition, it is shown that Kerker conditions also suffer from a spectral shift, which is quantified as a function of material purity.
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