@article{10902/9355,
year = {2016},
url = {http://hdl.handle.net/10902/9355},
abstract = {A new technique is presented to determine the complex permittivity of each layer for a bi-layer dielectric material. The bilayer material sample is loaded in a Ku-band rectangular waveguide WR62 and its two port S-parameters are measured as a function of frequency using the E8634A Network Analyzer. Also, by applying transmission (ABCD) matrix, expressions for the S-parameters of the bi-layer dielectric material as a function of complex permittivity of each layer are developed. To estimate the complex permittivity of each layer’s dielectric material, the square sums of errors between the measured and calculated S-parameters are minimised using a nonlinear optimization algorithm. The complex permittivity of each layer for a bi-layer dielectric material such as FR4-Teflon, FR4-Delrin and Delrin-Teflon are determined at the Ku-band frequencies, and the average relative errors between the individual dielectric materials and those of each individual layer of the bi-layer dielectric materials are calculated.},
publisher = {Kavala Institute of Technology},
publisher = {Journal of Engineering Science and Technology Review, 2016, 9(1), 61-65},
title = {Determination of the complex permittivity of each layer for a bi-layer dielectric material using transmission (ABCD) matrix in Ku-Band frequency},
author = {Elmajid, Hassan and Terhzaz, Jaouad and Ammor, Hassan and Chaibi, Mohamed and Mediavilla Sánchez, Ángel},
}