@article{10902/3761,
year = {2009},
month = {6},
url = {http://hdl.handle.net/10902/3761},
abstract = {We present an optical method for the nanoscopic inspection of surfaces. The method is based on the spectral and polarization analysis of the light scattered by a probe nanoparticle close to the inspected surface. We explore the sensitivity to changes either in the probe–surface distance or in the refractive index of the surface.},
publisher = {The Optical Society (OSA)},
publisher = {Optics Letters, Vol. 34, Issue 12, pp. 1906-1908 (2009)},
title = {Nanoscopic surface inspection by analyzing the linear polarization degree of the scattered light},
author = {Albella Echave, Pablo and Saiz Vega, José María and Sanz Casado, Juan Marcos and González Fernández, Francisco and Moreno Gracia, Fernando},
}