@conference{10902/2425,
year = {2008},
month = {4},
url = {http://hdl.handle.net/10902/2425},
abstract = {In this paper a new spectroscopic analysis technique is proposed for on-line welding quality monitoring. This approach is based on the estimation of the wavelength associated with the maximum intensity of the background signal (continuum) of the welding plasma spectra. It will be demonstrated that this parameter exhibits a clear correlation with the welding quality of the seams, as it also happens with the traditional spectroscopic approach based on the determination of the plasma electronic temperature, thus allowing an identification of the appearance of weld defects. This technique offers a relevant improvement in terms of computational performance, what enables to detect smaller defects within the seam.},
organization = {This work has been co-supported by the Spanish TEC’2005-08218-C02-02 and TEC’2007-67987-C02-01 projects. Authors want to thank S. Fernandez and J.J. Valdiande for their valuable help during the experimental tests, as well as the staff of ENSA (Equipos Nucleares S.A.), specially D. Solana, F. Linares and R. Cardoso},
publisher = {SPIE Society of Photo-Optical Instrumentation Engineers},
publisher = {Proceedings of SPIE, 2008, vol. 7003, 70030Q},
publisher = {Optical Sensors, Estrasburgo, 2008},
title = {Efficient processing technique based on plasma optical spectroscopy for on-line welding quality monitoring},
author = {Mirapeix Serrano, Jesús María and Cobo García, Adolfo and Cubillas de Cos, Ana María and Conde Portilla, Olga María and López Higuera, José Miguel},
}