@article{10902/18653,
year = {2020},
month = {1},
url = {http://hdl.handle.net/10902/18653},
abstract = {In this paper, a measurement method is presented to estimate the complex permittivity of a dielectric material even if its length is higher than the half wavelength in the waveguide. The Sij-parameters at reference planes in the rectangular waveguide loaded by material sample are measured by Network Analyzer. First of all, the expression of the complex permittivity as a function of Sij-parameters are calculated by applying the transmission lines theory. Further, a comparison of the estimated values of the complex permittivity obtained from the presented method and the Nicholson-Ross method is presented. Finally, the results for complex permittivity of Teflon, Nylon and Verde measured at the X-band frequencies are presented.},
publisher = {Electrical Engineering Department, University of Nevada},
publisher = {International Journal of Microwave and Optical Technology, 2020, 15(1), 10-16},
title = {An accurate method to estimate complex permittivity of dielectric materials at X-band frequencies},
author = {Ait Benali, Lahcen and Tribak, Abdelwahed and Terhzaz, Jaouad and Mediavilla Sánchez, Ángel},
}