@article{10902/14796,
year = {2018},
url = {http://hdl.handle.net/10902/14796},
abstract = {In this paper, a new measurement method is proposed to estimate the complex permittivity for each layer in a bi-layer dielectric material using a Ku-band rectangular waveguide WR62. The Sij-parameters at the reference planes in the rectangular waveguide loaded by a bi-layer material sample are measured as a function of frequency using the E8634A Network Analyzer. Also, by applying the transmission lines theory, the expressions for these parameters as a function of complex permittivity of each layer are calculated. The Nelder-Mead algorithm is then used to estimate the complex permittivity of each layer by matching the measured and calculated the Sij-parameters. This method has been validated by estimating, at the Ku-band, the complex permittivity of each layer of three bi-layer dielectric materials. A comparison of estimated values of the complex permittivity obtained from bi-layer measurements and mono-layer measurements is presented.},
publisher = {EMW Publishing},
publisher = {Progress In Electromagnetics Research M, 2018, 70, 109-116},
title = {Complex permittivity estimation for each layer in a bi-layer dielectric material at Ku-band frequencies},
author = {Ait Benali, Lahcen and Tribak, Abdelwahed and Terhzaz, Jaouad and Mediavilla Sánchez, Ángel},
}