@conference{10902/12019,
year = {2016},
url = {http://hdl.handle.net/10902/12019},
abstract = {We analyze the effect of contaminants on the quadrupolar magnetic, dipolar electric and dipolar magnetic resonances of silicon nanoparticles (NPs) by considering the spectral evolution of the linear polarization degree at right angle scattering configuration, PL(90º). From an optical point of view, a decrease in the purity of silicon nanoparticles due to the presence of contaminants impacts the NP effective refractive index. We study this effect for a silicon nanosphere of radius 200 nm embedded in different media. The weakness of the resonances induced on the PL(90º) spectrum because of the lack of purity can be used to quantify the contamination of the material. In addition, it is shown that Kerker conditions also suffer from a spectral shift, which is quantified as a function of material purity.},
organization = {This research was supported by MICINN (Spanish Ministry of Science and Innovation, project FIS2013-45854-P).},
publisher = {SPIE Society of Photo-Optical Instrumentation Engineers},
publisher = {Proc. of SPIE Vol. 9899 98991O-1},
title = {Using linear polarization for sensing and monitoring nanoparticle purity},
author = {Barreda Gómez, Ángela Inmaculada and Sanz Casado, Juan Marcos and Alcaraz de la Osa, Rodrigo and Saiz Vega, José María and Moreno Gracia, Fernando and González Fernández, Francisco and Videen, Gorden Wayne},
}